產(chǎn)品簡介
最大可進行8個器件的測試。最大測試管腳數(shù)1024Pin 雖然有一定的限制，但是可以復數(shù)同時印加。是滿足日本、國際規(guī)格的高可靠性設備(滿足JEITA/ESDA/JEDEC規(guī)格)。可用于閂鎖測試，并適用脈沖電流法、電源過電壓、ESD印加法，也可通過DC測試判斷pass/fail，以及作為可添加選項，可以利用向量來進行功能測試。
產(chǎn)品特性
產(chǎn)品應用
芯片封裝ESD測試
失效分析
規(guī)格參數(shù)
Model | HED-N5000 |
Capacity of power supply | 256 and 512 pins 100V/15A，768 and 1024 pins 100V/20A |
Pin number of max. measurement | 256 pins，512 pins，768 pins and 1024 pins |
Pulse zapping unit | MMx2 and HBMx2 are featured as standard |
Pulse voltage | MM:10~±4000V，HBM:10~±8000V(Option) |
Pulse voltage step | ±5V |
Pulse zapping number | 1~99 times |
Pulse interval | 0.1~9.9s |
Accuracy of charge voltage | 1%±10V |
Bias DC power supply | ±35V/1A (Option available) |
Vsupply over-voltage power ( for Latch-up test ) | 100V(1V step) |
Vf/lm measurement power supply | ±40V (0.1V step) /100mA (Option available) |
Accuracy of Vf/lm measurement | 1%±( 1/500FS±10nA) |
Pulse current supply | ±1A (1mA step) |
Max count power supply | 8 |
Wave form sampling ( for Latch-up test ) | 10MHz，Max.4000 points |
Destruction judgement | Changing amount judgement/Absolute value judgement |
Vector (Option) |
|
Outer dimensions | 1600mm(W)x900mm(D)x1500mm(H) |
Weight | 150 Kg~200 Kg |
Basic software(OS) | Windows |
